Test Instrument Reference

Data record instr.secondary-injection-test-set.pulse-ramping

Verified 2026-10-27 Confidence: High

Pickup is found by ramping the injected quantity; where a high-set overcurrent element would be overloaded by a sustained current, short pulses of increasing amplitude (pulse ramping) locate the pickup point while protecting the thermal rating of the relay.

ProvenanceMegger application page supports data record instr.secondary-injection-test-set.pulse-ramping, which is cited on the entry Secondary injection test set.SOURCEMegger application pageMegger application pageManufacturer pageDATA RECORDinstr.secondary-injection-test-set.pulse-rampinginstr.secondary-injectio..Verified 2026-10-27ENTRYSecondary injection test setSecondary injection test..No revisions
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StepItemDetail
SourceMegger application pageManufacturer page
Data recordinstr.secondary-injection-test-set.pulse-rampingVerified 2026-10-27
EntrySecondary injection test setNo revisions
Subject
Secondary injection test set (Instrument classes)
Kind
Instrument fact
Source
Megger application page, web page edition, Multi-phase relay testers for quick fault verification, Megger. Publisher page

History

Every recorded change to this data record, oldest first.
DateChange
2026-10-27created
2026-10-27review_status unreviewed -> software_reviewed

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"Data record instr.secondary-injection-test-set.pulse-ramping." Test Instrument Reference. 2026-10-27. https://www.testinstrumentreference.com/data/instr.secondary-injection-test-set.pulse-ramping/.