Test Instrument Reference

Data record instr.rcd-tester.trip-time-multiples

Verified 2026-10-27 Confidence: High

Trip time is measured with the test current set at a fraction of the device's rated residual current, at the rated current and at multiples of it, and the instrument reports the measured time at each level for comparison with the limits that apply to the device type.

ProvenanceSonel product page supports data record instr.rcd-tester.trip-time-multiples, which is cited on the entry RCD tester.SOURCESonel product pageSonel product pageManufacturer pageDATA RECORDinstr.rcd-tester.trip-time-multiplesinstr.rcd-tester.trip-ti..Verified 2026-10-27ENTRYRCD testerRCD testerNo revisions
Provenance. Where this record comes from and where it is used: the cited source, the record itself and the entry that cites it.
Provenance: the chain from source to entry.
StepItemDetail
SourceSonel product pageManufacturer page
Data recordinstr.rcd-tester.trip-time-multiplesVerified 2026-10-27
EntryRCD testerNo revisions
Subject
RCD tester (Instrument classes)
Kind
Method fact
Source
Sonel product page, web page edition, MPI-540 Multi-function meter of electrical system parameters, Sonel. Publisher page

History

Every recorded change to this data record, oldest first.
DateChange
2026-10-27created
2026-10-27revised
2026-10-27review_status unreviewed -> software_reviewed

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Cite the governing standard for the fact itself; cite this page as the finding aid.

"Data record instr.rcd-tester.trip-time-multiples." Test Instrument Reference. 2026-10-27. https://www.testinstrumentreference.com/data/instr.rcd-tester.trip-time-multiples/.