Data record instr.loop-impedance-tester.rcd-uplift
Verified 2026-10-27 Confidence: High
During a no-trip test the low test current can partly saturate the magnetic core of a residual current device, adding an impedance that is not part of the circuit; this RCD uplift inflates the reading and lowers the calculated fault current, and some instruments apply a measuring technique that removes it from the displayed value.
| Step | Item | Detail |
|---|---|---|
| Source | Megger knowledge hub article | Manufacturer page |
| Data record | instr.loop-impedance-tester.rcd-uplift | Verified 2026-10-27 |
| Entry | Loop impedance tester | No revisions |
- Subject
- Loop impedance tester (Instrument classes)
- Kind
- Instrument fact
- Source
- Megger knowledge hub article, 2026-02-03 edition, Why RCD Uplift Matters for Loop Impedance Testing, Megger. Publisher page
History
| Date | Change |
|---|---|
| 2026-10-27 | created |
| 2026-10-27 | review_status unreviewed -> software_reviewed |
Cite this page
Cite the governing standard for the fact itself; cite this page as the finding aid.
"Data record instr.loop-impedance-tester.rcd-uplift." Test Instrument Reference. 2026-10-27. https://www.testinstrumentreference.com/data/instr.loop-impedance-tester.rcd-uplift/.
Test Instrument Reference, Data record instr.loop-impedance-tester.rcd-uplift (Oct. 27, 2026), https://www.testinstrumentreference.com/data/instr.loop-impedance-tester.rcd-uplift/.
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title = {Data record instr.loop-impedance-tester.rcd-uplift},
howpublished = {\url{https://www.testinstrumentreference.com/data/instr.loop-impedance-tester.rcd-uplift/}},
organization = {Test Instrument Reference},
publisher = {Test Instrument Reference},
year = {2026},
note = {last substantive change 2026-10-27}
}{{cite web |title=Data record instr.loop-impedance-tester.rcd-uplift |website=Test Instrument Reference |publisher=Test Instrument Reference |url=https://www.testinstrumentreference.com/data/instr.loop-impedance-tester.rcd-uplift/ |date=2026-10-27 |access-date=}}